IEC 60749-30 Ed. 2.0 b:2020

$41.00

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IEC 60749-30 Ed. 2.0 b:2020

$41.00

Semiconductor devices – Mechanical and climatic test methods – Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
standard by International Electrotechnical Commission, 08/17/2020

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Description

IEC 60749-30:2020 establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing. The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative of a typical industry multiple solder reflow operation.

Product Details

Edition:
2.0
Published:
08/17/2020
Number of Pages:
26
File Size:
1 file , 1.1 MB